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IRUCAA@TDC >
040 歯科学報 = THE SHIKWA GAKUHO >
Vol.112 no.04 (2012) >
Please use this identifier to cite or link to this item:
http://hdl.handle.net/10130/2907
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| Title: | Hemifacial microsomia における３次元座標を用いた頭蓋形態評価 |
| Authors: | 有泉, 大
坂本, 輝雄
石井, 武展
末石, 研二 |
| Others: | 歯科矯正学 |
| Publisher: | 東京歯科大学学会 |
| ISSN: | 0037-3710 |
| URI: | http://hdl.handle.net/10130/2907 |
| Journal Title: | 歯科学報 |
| Date of Issued: | 2012-08-30 |
| Volume: | 112 |
| Issue: | 4 |
| Start Page: | 557 |
| End Page: | 557 |
| NCID: | AN0009999X |
| Appears in Collections: | Vol.112 no.04 (2012)
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